Description
Features
- Laser-etched lines and grids for micron-level accuracy
- High-contrast design for easy visibility under microscopes
- Available in various materials including glass, metal, and plastic
- Multiple sizes and patterns to suit diverse calibration needs
Applications
- Microscope magnification calibration
- Imaging system verification
- Biological, materials science, and electronics research
- XY translation stage and optical system calibration
Benefits
- Ensures precise and reliable measurements of samples
- Enhances accuracy in scientific experiments and industrial processes
- Versatile selection of scales, rulers, and grids for different use cases
- Durable construction for long-term laboratory or field use
Performance
- Maintains high precision under repeated use
- Provides consistent reference points for accurate system calibration
- Laser-etched grids minimize errors and maximize reproducibility
- Compatible with a variety of microscopes, imaging devices, and measurement setups
Specifications
Substrate | B270 |
Dimensional Tolerance | -0.1mm |
Thickness Tolerance | ±0.05mm |
Surface Flatness | 3(1)@632.8nm |
Surface Quality | 40/20 |
Line Width | 0.1mm & 0.05mm |
Edges | Ground , 0.3mm max. Full width bevel |
Clear Aperture | 90% |
Parallelism | <45” |
Coating | High optical density opaque chrome,Tabs<0.01%@Visible Wavelength |
Transparent Area, AR R<0.35%@Visible Wavelength |
